Interface analysis of Mg/Sc and Sc/Mg bilayers using X-ray reflectivity
نویسندگان
چکیده
Mg/Sc and Sc/Mg bilayers were studied to investigate their interfaces. Time-of-flight secondary ion mass spectroscopy grazing incidence x-ray reflectivity are combined determine the realistic structure of bilayer stack: thickness, refractive index, roughness layers interlayers respectively. In addition, soft measurements provide sensitive information about chemical environment scandium, when incident photon energy is tuned in vicinity Sc L-absorption edge (∼ 400 eV). Both Mg-on-Sc Sc-on-Mg interfaces have high (∼1 nm) a MgSc compound interlayer but shown be asymmetric.
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ژورنال
عنوان ژورنال: Thin Solid Films
سال: 2022
ISSN: ['1879-2731', '0040-6090']
DOI: https://doi.org/10.1016/j.tsf.2022.139595